【英文标准名称】:Harmonizedsystemofqualityassessmentforelectroniccomponents.Generalspecification:semiconductoroptoelectronicandliquidcrystaldevices
【原文标准名称】:电子元器件质量评定协调体系.光电子和液晶半导体器件总规范
【标准号】:BSEN120000-1996
【标准状态】:现行
【国别】:英国
【发布日期】:1996-09-15
【实施或试行日期】:1996-09-15
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:资格鉴定;规范(批准);光分布;耦合器;耐久试验;光电晶体管;认可试验;发光二极管;电路;外观检查(试验);发光器件;液晶器件;电阻测量;质量保证体系;手册;光电子器件;检验;电学测量;半导体器件;电压测量;评估的质量;性能试验;作标记;电流测量;名称与符号;光学测量;抽样方法;环境试验;电子设备及元件;光电二极管;机械试验;验证;缺陷与故障;规范(验收);能力鉴定;质量控制;试验条件;电气试验;试验设备;详细规范;统计质量控制
【英文主题词】:Approvaltesting;Capabilityapproval;Circuits;Couplers;Currentmeasurement;Defects;Designations;Detailspecification;Electricalmeasurement;Electricaltesting;Electronicequipmentandcomponents;Endurancetesting;Environmentaltesting;Genericspecification;Handbooks;Inspection;Lightdistribution;Light-emittingdevices;Light-emittingdiodes;Liquidcrystaldevices;Liquidcrystals;Marking;Mechanicaltesting;Opticalmeasurement;Optoelectronicdevices;Performancetesting;Photodiodes;Phototransistors;Qualificationapproval;Qualityassessment;Qualityassurancesystems;Qualitycontrol;Resistancemeasurement;Samplingmethods;Semiconductordevices;Specification;Specification(approval);Statisticalqualitycontrol;Testequipment;Testingconditions;Verification;Visualinspection(testing);Voltagemeasurement
【摘要】:Specifiesqualityassessmentprocedures,testmethodsandterminologyrequiredinthepreparationofdetailedspecificationsforoptoelectronicandliquidcrystaldevices.
【中国标准分类号】:L53
【国际标准分类号】:31_120;31_260
【页数】:276P.;A4
【正文语种】:英语